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IIO: core: Modify scan element type

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The current scan element type uses the following format:
  [be|le]:[s|u]bits/storagebits[>>shift].
To specify multiple elements in this type, added a repeat value.
So new format is:
  [be|le]:[s|u]bits/storagebitsXr[>>shift].
Here r is specifying how may times, real/storage bits are repeating.

When X is value is 0 or 1, then repeat value is not used in the format,
and it will be same as existing format.

Signed-off-by: Srinivas Pandruvada <srinivas.pandruvada@linux.intel.com>
Signed-off-by: Jonathan Cameron <jic23@kernel.org>
This commit is contained in:
Srinivas Pandruvada
2014-04-29 00:51:00 +01:00
committed by Jonathan Cameron
parent 9fbfb4b37e
commit 0ee8546ac0
2 changed files with 42 additions and 6 deletions
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7
include/linux/iio/iio.h
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@@ -177,6 +177,12 @@ struct iio_event_spec {
* shift: Shift right by this before masking out
* realbits.
* endianness: little or big endian
* repeat: Number of times real/storage bits
* repeats. When the repeat element is
* more than 1, then the type element in
* sysfs will show a repeat value.
* Otherwise, the number of repetitions is
* omitted.
* @info_mask_separate: What information is to be exported that is specific to
* this channel.
* @info_mask_shared_by_type: What information is to be exported that is shared
@@ -219,6 +225,7 @@ struct iio_chan_spec {
u8 realbits;
u8 storagebits;
u8 shift;
u8 repeat;
enum iio_endian endianness;
} scan_type;
long info_mask_separate;